000 00532nam a22001697a 4500
003 inkolt
005 20240725140950.0
008 240711s2024 ii ||||| |||| 00| 0 eng d
082 _a004
_bKAP
100 _aKapil, Bhavesh
_912460
245 _aFabric defect detection using deep learning /
_cBhavesh Kapil.
260 _aHamirpur :
_bNational Institute of Technology,
_c2024
300 _aix, 44p.
502 _bMaster of Technology
_cCS-NITH
_d2024
720 _aDutta, Kamlesh
_eGuide / Supervisor
942 _cTD
_n0
_xRajesh Pal Patial
_y6
_z Rajesh Pal Patial
999 _c6043
_d6043