Analysis of underlap fully depleted strained soi mosfet
By: Sharma, Rajneesh
Material type: TextPublisher: Hamirpur : National Institute of Technology, 2017Description: xxviii, 178pDDC classification: 621.38 Dissertation note: Doctor of Philosophy, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2017 Guide / Supervisor: Rana, Ashwani KumarItem type | Current location | Call number | Status | Date due | Barcode |
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Thesis or Dissertation | Central Library On Display | 621.38 SHA (Browse shelf) | Available | Th-436 | |
Thesis or Dissertation | Electronics and Communication Engineering (Departmental Library) On Display | 621.38 SHA (Browse shelf) | Available | EC-TR-15 |
Doctor of Philosophy, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2017
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