Fabric defect detection using deep learning / Bhavesh Kapil.
By: Kapil, Bhavesh
Material type: TextPublisher: Hamirpur : National Institute of Technology, 2024Description: ix, 44pDDC classification: 004 Dissertation note: Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024 Guide / Supervisor: Dutta, KamleshItem type | Current location | Call number | Status | Date due | Barcode |
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Thesis or Dissertation | Central Library | 004 KAP (Browse shelf) | Available | TH-2435 |
Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024
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