Digital twin solution for faunt detection in time-critical IIoT application / Ranpariya Amish.
By: Amish, Ranpariya
Material type:
TextPublisher: Hamirpur : National Institute of Technology, 2024Description: viii, 46pDDC classification: 004 Dissertation note: Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024 Guide / Supervisor: Sharma, Sangeeta
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Thesis or Dissertation
|
Central Library | 004 AMI (Browse shelf) | Available | TH-2130 |
Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024
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