Saini, Kanchan <br/><br/>
Comparative analysis of vertically stacked nanosheet-all around field effect transistors / 
Kanchan Saini. 
 - Hamirpur :  National Institute of Technology,  2024 
 - ix, 62p. 
<br/><br/>
<br/><br/><label>Dewey Class. No.: </label>621.38  / SAI