Amish, Ranpariya  <br/><br/>
Digital twin solution for faunt detection in time-critical IIoT application / 
Ranpariya Amish. 
 - Hamirpur :  National Institute of Technology,  2024 
 - viii, 46p. 
<br/><br/>
<br/><br/><label>Dewey Class. No.: </label>004  / AMI