Comparative analysis of vertically stacked nanosheet-all around field effect transistors / Kanchan Saini.
By: Saini, Kanchan
Material type: TextPublisher: Hamirpur : National Institute of Technology, 2024Description: ix, 62pDDC classification: 621.38 Dissertation note: Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024 Guide / Supervisor: Kumar, VinodItem type | Current location | Call number | Status | Date due | Barcode |
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Thesis or Dissertation | Central Library | 621.38 SAI (Browse shelf) | Available | TH-2532 |
Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024
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