Fabric defect detection using deep learning / Bhavesh Kapil.

By: Kapil, Bhavesh
Material type: TextTextPublisher: Hamirpur : National Institute of Technology, 2024Description: ix, 44pDDC classification: 004 Dissertation note: Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024 Guide / Supervisor: Dutta, Kamlesh
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004 KAP (Browse shelf) Available TH-2435

Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024

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