Digital twin solution for faunt detection in time-critical IIoT application / Ranpariya Amish.

By: Amish, Ranpariya
Material type: TextTextPublisher: Hamirpur : National Institute of Technology, 2024Description: viii, 46pDDC classification: 004 Dissertation note: Master of Technology, Department of Computer Science and Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2024 Guide / Supervisor: Sharma, Sangeeta
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