A delay-aware implicit based test scheme for diagnosis and concurrent error detection
By: Agrahari, Vaibhav
Material type: TextPublisher: Hamirpur : National Institute of Technology, 2022Description: xi, 42pDDC classification: 621.38 Dissertation note: Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2022 Guide / Supervisor: Daniel, PhilemonItem type | Current location | Call number | Status | Date due | Barcode |
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Thesis or Dissertation | Central Library On Display | 621.38 AGR (Browse shelf) | Available | TH-1514 | |
Thesis or Dissertation | Electronics and Communication Engineering (Departmental Library) On Display | 621.38 AGR (Browse shelf) | Available | EC-DR-413 |
Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2022
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