Thin film materials: stress, defect formation, and surface evolution / L.B. Freund, S. Suresh.
By: Freund, L.B
Contributor(s): Suresh, S
Material type: TextPublisher: New York: Cambridge University Press; 2010Edition: 34th edDescription: xviii, 750 pISBN: 9780511754715Subject(s): Thin films | Surfaces (Technology)DDC classification: 621.38152 Online resources: Click here to access online
Table of contents:
1. Introduction and Overview --
2. Film stress and substrate curvature --
3. Stress in anisotropic and patterned films --
4. Delamination and fracture --
5. Film buckling, bulging and peeling --
6. Dislocation formation in epitaxial systems --
7. Dislocation interactions and strain relaxation --
8. Equilibrium and stability of surfaces --
9. The role of stress in mass transport.
Summary:
Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections.
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