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Analysis of underlap fully depleted strained soi mosfet

By: Sharma, Rajneesh

Material type: Text

TextPublisher: Hamirpur : National Institute of Technology, 2017Description: xxviii, 178pDDC classification: 621.38 Dissertation note: Doctor of Philosophy, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2017 Guide / Supervisor: Rana, Ashwani Kumar

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Item type	Current location	Call number	Status	Date due	Barcode
Thesis or Dissertation	Central Library On Display	621.38 SHA (Browse shelf)	Available		Th-436
Thesis or Dissertation	Electronics and Communication Engineering (Departmental Library) On Display	621.38 SHA (Browse shelf)	Available		EC-TR-15

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Doctor of Philosophy, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2017

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Analysis of underlap fully depleted strained soi mosfet

By: Sharma, Rajneesh

Browsing Central Library shelves, Shelving location: On Display Close shelf browser