Fault detection and diagnosis of SRAM based FPGA through BIST.

By: Babu, G. Surender
Material type: TextTextPublisher: Hamirpur : National Institute of Technology, 2011Description: v, 45pGenre/Form: Thesis or Dissertation DDC classification: 621.38 Dissertation note: Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2011 Guide / Supervisor: Daniel, Philemon.
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Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2011

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