Fault detection and diagnosis of SRAM based FPGA through BIST.
By: Babu, G. Surender
Material type: TextPublisher: Hamirpur : National Institute of Technology, 2011Description: v, 45pGenre/Form: Thesis or Dissertation DDC classification: 621.38 Dissertation note: Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2011 Guide / Supervisor: Daniel, Philemon.Item type | Current location | Call number | Status | Date due | Barcode |
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Thesis or Dissertation | Electronics and Communication Engineering (Departmental Library) On Display | 621.38 BAB (Browse shelf) | Available | EC-DR-57 |
Master of Technology, Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005. 2011
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