Analysis of underlap fully depleted strained soi mosfet (Record no. 3481)

000 -LEADER
fixed length control field 00540nam a22001697a 4500
003 - CONTROL NUMBER IDENTIFIER
control field inkolt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240409144259.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201203s2017 ii ||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38
Item number SHA
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Sharma, Rajneesh
245 1# - TITLE STATEMENT
Title Analysis of underlap fully depleted strained soi mosfet
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Hamirpur :
Name of publisher, distributor, etc. National Institute of Technology,
Date of publication, distribution, etc. 2017
300 ## - PHYSICAL DESCRIPTION
Extent xxviii, 178p.
502 ## - DISSERTATION NOTE
Degree type Doctor of Philosophy,
Name of granting institution Department of Electronics and Communication Engineering, National Institute of Technology Hamirpur, Himachal Pradesh, India - 177005.
Year degree granted 2017
720 ## - ADDED ENTRY--UNCONTROLLED NAME
Name Rana, Ashwani Kumar
Relator term Guide / Supervisor
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis or Dissertation
Suppress in OPAC No
Entered by Rajesh Pal Patial
942 ## - ADDED ENTRY ELEMENTS (KOHA)
-- Rajesh Pal Patial
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Permanent Location Current Location Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
          Central Library Central Library On Display 2020-12-03   621.38 SHA Th-436 2020-12-03 2020-12-03 Thesis or Dissertation
          Electronics and Communication Engineering (Departmental Library) Electronics and Communication Engineering (Departmental Library) On Display 2022-12-20   621.38 SHA EC-TR-15 2022-12-20 2022-12-20 Thesis or Dissertation
Supported by Central Library, NIT Hamirpur
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