Amish, Ranpariya
Digital twin solution for faunt detection in time-critical IIoT application / Ranpariya Amish. - Hamirpur : National Institute of Technology, 2024 - viii, 46p.
004 / AMI
Digital twin solution for faunt detection in time-critical IIoT application / Ranpariya Amish. - Hamirpur : National Institute of Technology, 2024 - viii, 46p.
004 / AMI