Patel, Nitika
Analysis of strain engineered fin fet for cmos technology - Hamirpur : National Institute of Technology, 2019. - xiv, 63p.
Thesis or Dissertation
621.38 / PAT
Analysis of strain engineered fin fet for cmos technology - Hamirpur : National Institute of Technology, 2019. - xiv, 63p.
Thesis or Dissertation
621.38 / PAT