कोहा @ रा.प्रौ.सं.ह. / KOHA @ NITH catalog

Normal view MARC view ISBD view

Pal, Pankaj Kumar.

Analysis of metal gate double gate (MGDG) MOSFET's from device variability perspective. - Hamirpur : National Institute of Technology, 2010. - xiii, 64p.

Index Terms--Genre/Form:
Thesis or Dissertation

Dewey Class. No.: 621.38 / PAL

Print
Add to your cart (remove)
Send to device
Save record
More searches